Subho Sankar Banerjee
Subho is a Software Engineer focusing on fleet-scale reliability and ML-driven systems initiatives at Google. He holds a PhD in Computer Science from the University of Illinois at Urbana-Champaign.
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Silent Data Corruption by 10× Test Escapes Threatens Reliable Computing
Subhasish Mitra
Rama Govindaraju
Eric Liu
Mike Fuller
IEEE Design & Test, 42, Issue 6 (2025), pp. 40-53
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Summary:
Silent Data Corruption by 10x Test Escapes Threatens Reliable Computing" highlights a critical issue: manufacturing defects, dubbed "test escapes," are evading current testing methods at an alarming rate, ten times higher than industry targets. These defects lead to Silent Data Corruption (SDC), where applications produce incorrect outputs without error indications, costing companies significantly in debugging, data recovery, and service disruptions. The paper proposes a three-pronged approach: quick diagnosis of defective chips directly from system-level behaviors, in-field detection using advanced testing and error detection techniques like CASP, and new, rigorous test experiments to validate these solutions and improve manufacturing testing practices.
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